페이지 정보 작성자 관리자 댓글 0건 조회 240회 작성일 22-04-01 15:48 Publication 목록 Journal Study of the evolution of nanoscale roughness from the line edge of exposed resist to the sidewall of deep-etched InP/InGaAsP heterostructures Author : J. H. Jang, W. Zhao, J. W. Bae, I. Adesida, A. Lepore, M. Kwakernaak and J. H. Abeles Source Journal of Vacuum Science and Technology B, 22, pp. 2538-2541, 2004. Year 2004 본문 목록