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Introduction
Members
Professor
Postdoc
PhD student
M.S. student
Alumni
Project
Research
Compound Semiconductor Devices
Solar cell
THz technology
Publication
Journal
Conference
Patents
Equipment
Fabrication
Measurement
Community
News
Gallery
Publication
Journal
Conference
Patents
Publication 카테고리
전체
Journal
Conference
Patents
검색대상
제목
Author
Year
Source
검색어
필수
검색
Total 389건
14 페이지
Experimental study of masking scheme effects on the nanoscale sidewall roughness of deep etched InP/…
Author
W. Zhao, J. W. Bae, J. H. Jang, I. Adesida, M. Kwakernaak, A. Lepore, J. H. Abeles
Year
2004
Source
Proceeding of Electronic Materials Conference, P2, p. 42, 2004.
Indium-Phosphide-based microresonator modulators and wavelength multiplexers
Author
J. H. Abeles, M. H. Kwakernaak, H. Mohseni, A. N. Lepore, G. A. Pajer, G. Griffel, T. P. Lee, A. M. Braun, D. R. Bechtle, Z. A. Shellenbarger, I. Adesida, S. Rommel, J. W. Bae and J. H. Jang
Year
2004
Source
2004 Digest of the LEOS Summer Topical Meeting, TuC4.6, pp. 60-61, 2004.
Calculation of Scattering loss utilizing the sidewall roughness information of InP/InGaAsP optical w…
Author
W. S. Choi and J. H. Jang
Year
2004
Source
Photonics Conference 2004, TP-23, 2004.
Wavelength selective WDM modulator with high-Q ring resonators in deeply etched InP/InGaAsP waveguid…
Author
M. H. Kwakernaak, A. N. Lepore, H. Mohseni, N. Maley, H. An, Z. A. Shellenbarger, A. M. Braun, W. K. Chan, J. H. Abeles, J. W. Bae, J. H. Jang and I. Adesida
Year
2004
Source
Technical Digest of Lasers and Electro-optics, 2, pp. 112-113, 2004.
금속에 따른 p-GaAsSb 오믹 접촉의 전기적 특성에 관한 비교 연구
Author
S. W. Cho and J. H. Jang
Year
2004
Source
Proceeding of the KIEEME Annual Autumn Conference 2004, pp. 33-36, 2004.
Characterization of sidewall roughness of InP/InGaAsP etched using inductively coupled plasma for lo…
Author
J. W. Bae, W. Zhao, J. H. Jang, I. Adesida, A. Lepore, M. Kwakernaak and J. H. Abeles
Year
2003
Source
EIPBN, 2003.
Long-wavelength metamorphic InGaAs detectors on GaAs substrates
Author
J. H. Jang, W. E. Hoke and I. Adesida
Year
2003
Source
LEOS annual meeting, pp. 919-920, 2003.
Characterization of sidewall roughness of InP/InGaAsP etched using inductively coupled plasma for lo…
Author
J. W. Bae, W. Zhao, J. H. Jang, I. Adesida, A. Lepore, M. Kwakernaak, and J. H. Abeles
Year
2003
Source
Journal of Vacuum Science and Technology B. pp. 2888-2891, 2003.
Direct measurement of nanoscale sidewall roughness of optical waveguides using atomic force microsco…
Author
J. H. Jang, W. Zhao, J. W. Bae, D. Selvanathan, S. L. Rommel, I. Adesida, A. Lepore, M. Kwakernaak and J. H. Abeles
Year
2003
Source
Applied Physics Letters, pp. 4116-4118, 2003.
Metamorphic PIN Photodetectors
Author
I.Adesida, 장재형, S.Kim, J.W.Bae, W.E. Hoke
Year
2003
Source
Metamorphic PIN Photodetectors, LEOS annual meeting, pp. 000, 2003.
Properties of Metamorphic Materials and Device Structures on GaAs Substrates
Author
W. E. Hoke, T. D. Kennedy, A. Torabi, C. S. Whelan, P. F. Marsh, R. E. Leoni, J. H. Jang, I. Adesida and K. C. Hsieh
Year
2003
Source
Journal of Crystal Growth, 251, pp. 804-810, 2003.
Wavelength dependent characteristics of High speed Metamorphic P-i-I-N Photodiodes
Author
J. H. Jang, W. E. Hoke, P. Fay and I. Adesida
Year
2003
Source
IEEE Photonics Technology Letters, vol. 15, no. 2, pp. 281-283, 2003.
Monolithic Integration of In0.53Ga0.47As photodiodes and In0.53Ga0.47As/In0.52Al0.48As HEMTs on Meta…
Author
J. H. Jang, G. Cueva, W. E. Hoke, R. Sankaralingam, P. Pay and I. Adesida
Year
2002
Source
Technical Digest of GaAs IC symposium, pp. 55-58, 2002.
Properties of Metamorphic Materials and Device Structures on GaAs Substrates
Author
W. E. Hoke, T. D. Kennedy, A. Torabi, C. S. Whelan, P. F. Marsh, R. E. Leoni, J. H. Jang, I. Adesida and K. C. Hsieh
Year
2002
Source
Invited to 21th North American Conf. On MBE, pp. 69-70, 2002.
Metamorphic Graded Bandgap InGaAs/InGaAlAs/InAlAs Double Heterojunction P-i-I-N Photodiodes
Author
J. H. Jang, G. Cueva, W. E. Hoke, P.J. Lemonias, P. Fay, and I. Adesida
Year
2002
Source
IEEE Journal of Lightwave Technology, vol. 20, no.3, pp. 507-514, March 2002
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