페이지 정보 작성자 관리자 댓글 0건 조회 290회 작성일 22-04-04 16:52 Publication 목록 게시판 리스트 옵션 검색 Conference Properties of Conductive Oxygen Vacancies and Compact Modeling of IV Characteristics in HfO2 Resistive Random-Access-Memories Author : Junsung Park, Min-Jae Kim, Jae-Hyung Jang, and Sung-Min Hong Source International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), pp. 217-220 Year 2020 본문 목록